FREE SEMINAR TOUR: Pulsed IV | TriState PIV | Load Pull | Passiv | Active | Hybrid

TriState pulse measurement technique for memory effects on GaN devices | Innovations for wave load pull from 10 MHz to 220 GHz

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CAM - Workshop: Innovation in Failure Analysis and Material Diagnostics of Electronics Components 2019

CAM-Workshop: »Innovation in Failure Analysis and Material Diagnostics of Electronics Components«

Location: Leibniz-Institute of Agricultural Development (IAMO), Halle (Saale)
Date: 10.-11. April 2019

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